The JM580BD is built around an 8-inch stage with 210 × 210 mm travel and a quick-release mechanism, so a full wafer can be reviewed without re-clamping. The upright optical path with long working distance objectives leaves room for thick samples and probe fixtures.
Brightfield, darkfield and polarized observation are standard; a Nomarski DIC slider is available for topography and step-height contrast.
| Eyepieces | SWH10×-H/23 mm erect image high-eyepoint (25 mm optional) |
|---|---|
| Objectives | Infinity long WD darkfield semi-apochromatic: 5× NA 0.15 WD 14.8, 10× NA 0.30 WD 8.5, 20× NA 0.40 WD 11.9, 50× NA 0.75 |
| Optical magnification | 50×–500× (50×–1000× with optional 100×) |
| Digital magnification | 150×–3000× with 12 MP camera and 22" monitor |
| Viewing head | Erect image trinocular, interpupillary 50–76 mm, R:T 100:0 / 50:50 |
| Nosepiece | 5-position brightfield, DIC slot |
| Focusing | Coaxial coarse/fine, coarse travel 35 mm, fine 0.001 mm |
| Stage | 525 × 330 mm, travel 210 × 210 mm, quick-release |
| Polarization | Polarizer slider, 360° rotating analyzer |
| Reflected illumination | BF/DF illuminator, aperture and field diaphragm, 5 W LED |
| Transmitted illumination | 10 W LED, pre-centred |
| Condenser | Swing-out achromatic NA 0.9 |
| Camera port | 0.65× (1× / 0.5× optional) |
| Interference | Nomarski DIC slider (optional) |
| Imaging options | 12 MP or 20 MP camera; measurement and stitching software |
Tell us the material and what you need to measure. We reply within one business day with a configuration and price.
