The JM540BD adds darkfield to a research-grade metallurgical platform. Brightfield shows colour and reflectivity; darkfield isolates scratches, particles and edge defects that disappear against a bright background. Switching between the two is a lever on the illuminator — no module change.
The 310 × 240 mm stage and 150 × 100 mm travel accommodate PCB panels and larger metal sections, while long working distance objectives keep clearance for mounted samples.
| Eyepieces | PL10×/23 mm high-eyepoint wide field |
|---|---|
| Objectives | Infinity long WD darkfield semi-apochromatic: 5× NA 0.15 WD 15, 10× NA 0.30 WD 8.4, 20× NA 0.40 WD 11.9, 50× NA 0.75 WD 3 |
| Optical magnification | 50×–500× (50×–1000× with optional 100× objective) |
| Digital magnification | 150×–3000× with 12 MP camera and 22" monitor |
| Viewing head | Trinocular hinged, interpupillary 50–76 mm, R:T 100:0 / 50:50 |
| Nosepiece | 5-position brightfield, DIC slot |
| Focusing | Coaxial coarse/fine, coarse travel 35 mm, fine 0.001 mm, anti-drift, upper limit stop |
| Stage | 310 × 240 mm, travel 150 × 100 mm, coaxial X-Y |
| Polarization | Polarizer slider, 360° rotating analyzer |
| Reflected illumination | BF/DF illuminator, variable aperture and field diaphragm, filter slot, 5 W LED |
| Transmitted illumination | 5 W LED, pre-centred |
| Condenser | Swing-out achromatic NA 0.9 |
| Camera port | 0.65× dedicated C-mount |
| Interference | DIC slider (optional) |
| Imaging options | 12 MP or 20 MP camera; measurement and stitching software |
Tell us the material and what you need to measure. We reply within one business day with a configuration and price.
