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Difference between near-infrared microscope NIR and short-wave infrared microscope SWIR

2026-08-12 · Yikmo Optics technical notes

Conventional coverage 780nm ~ 1100nm, partially extended to 1700nm

Conventional coverage 1000nm ~ 2500nm, covering molecular frequency synthesis and frequency doubling absorption interval

Mainly using scattered and reflected near-infrared light imaging, there is a weak absorption response to some hydrogen-containing groups (C-H, O-H, N-H), mainly based on morphological observation, and weak component recognition ability

Using the characteristic frequency doubling and frequency combining absorption of hydrogen-containing groups (O-H, C-H, N-H, S-H, etc.) in this band to achieve imaging, the morphology and chemical composition distribution information can be obtained at the same time, and the composition identification ability is strong.

The penetration depth of biological tissues and porous materials is shallow, and only surface or superficial information can be obtained.

Longer wavelength, weaker scattering effect, deeper penetration depth of dense materials, biological tissues, packaging materials, sub-surface structure and composition information can be obtained

More use of silicon-based detectors, mature technology, low cost

More costly with InGaAs and MCT detectors

Shorter wavelengths, smaller diffraction limits, higher spatial resolution

Wavelength is longer, diffraction limit is larger, spatial resolution is slightly lower than NIR under the same optical system

The moisture absorption is weak in the near-infrared range, and the interference to the detection of aqueous samples is small.

Moisture has a strong characteristic absorption in the SWIR interval (especially at ~ 1450nm and ~ 1900nm), and high water content samples will cause strong signal interference

· Surface morphology observation samples: semiconductor wafer surface defect detection, photovoltaic cell surface crack detection, electronic component surface microstructure characterization, focusing on the observation of micron-scale surface morphology defects

· Imaging of opaque light-colored samples: observation of the surface fiber structure of paper and textile materials, analysis of the surface particle morphology of food raw materials, and clear imaging with NIR low absorption and high contrast

· Shallow dynamic observation of living cells: Shallow dynamic imaging of living cells and tissue sections, low phototoxicity of NIR to cells, and small moisture interference, suitable for short-term live cell observation

· Transparent/translucent material internal defect detection: glass, transparent plastics, inclusions in transparent films, air bubbles, scratch detection, detection of tiny impurities inside silicon wafers, NIR can penetrate transparent semiconductors and inorganic materials for clear internal defect imaging

· Chemical composition distribution imaging samples: distribution characterization of active pharmaceutical ingredients (APIs) and excipients in pharmaceutical preparations, phase separation analysis of polymer blends, spatial distribution detection of starch/protein/fat in agricultural products, qualitative and quantitative imaging using characteristic absorption of different components

· Penetrating packaging non-destructive testing samples: invisible paper, plastic packaging drug, food testing, SWIR can penetrate ordinary packaging materials, directly identify the composition and defects of the interior, suitable for non-destructive sampling

· Subsurface detection of high scattering thick samples: Subsurface structure and delamination defect detection of multilayer composites (such as carbon fiber composites, photovoltaic laminate components), deep lesion imaging of biological tissues, weak SWIR scattering at longer wavelengths, penetration depth far higher than NIR

· Internal detection of silicon-based semiconductors: detection of internal dislocations, impurities, and body defects in crystalline silicon blocks and silicon wafers. The absorption of silicon materials in the SWIR band is extremely low, enabling complete imaging of internal defects in the silicon matrix, which is impossible to achieve with NIR

· Natural product composition analysis: imaging of the distribution of active ingredients of Chinese medicinal materials, analysis of the distribution of sugar and alkaloids in tobacco, detection of crude oil distribution in the pores of petroleum cores, and in-situ distribution characterization by SWIR characteristic absorption of different organic components

Only look at the surface defects of the sample: near-infrared microscope can meet, cost-effective;

You need to penetrate the sheet to see the pores, inclusions and grain boundary defects inside the crystal (TGG/TSAG/CeF Faraday material), you must choose a short-wave infrared SWIR microscope,

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